Disciplines
Mathematics (40%); Economics (60%)
Keywords
Autocorrelation Robustness,
Finite Sample Results,
High Power,
Adaptive Adjustments,
Concentration Subspaces
Abstract
In many disciplines data are recorded over time. Such data are then often analyzed with
regression models, and decisions are based on the outcome of tests of statistical hypotheses
concerning a linear restriction on the regression coefficients. Since the data are recorded
over time, they are frequently strongly autocorrelated. Therefore it is inevitable that the tests
used are ``autocorrelation robust in the sense that they are not ``distorted by the presence
of autocorrelation in the data. Unfortunately, in Preinerstorfer and Pötscher (2013) and
Preinerstorfer (2014) we have shown analytically that standard procedures used in practice
will lead to wrong decisions with high probability if the autocorrelation in the data is strong,
i.e., the standard procedures available are not autocorrelation robust. We have also shown
(under certain technical assumptions) how existing tests can be adjusted to obtain
autocorrelation robust tests. Our adjustments are based on additional invariance properties
that amount to effectively ignoring a certain part of information in the data from the outset.
Even though our adjustments often yield valid tests, there remain many challenging open
questions concerning: (1) the improvement of these adjusted tests by using the data to
decide if (and which) information in the data should be ``ignored; (2) the applicability of the
adjustment procedures to other testing problems than linear equality restrictions (e.g., testing
one-sided hypotheses or testing for structural breaks in the regression coefficients at an
unknown time point); and (3) the generalizability of this approach to other models (e.g.,
dynamic, non-linear, or non-parametric models). The goal of the proposed project is to
optimize the adjusted tests with respect to their power properties, and then to extend these
powerful procedures to more general hypothesis testing problems and to a large variety of
models.