Improved ELNES interpretation
Improved ELNES interpretation
Disciplines
Physics, Astronomy (100%)
Keywords
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FESTKÖRPERPHYSIK,
BANDSTRUKTUR,
ENERGIEVERLUST-SPEKTROMETRIE,
ELEKTRONISCHE EIGENSCHAFTEN
The fine structure in ionization edges (ELNES, Electron Energy Loss Near Edge Structures) mirrors the density of unoccupied states above the Fermi energy. It is thus an important source of information on the electronic structure of materials. A better understanding of the ELNES will lead to a wide range of applications related to the macroscopic properties of materials. In the present project, it is planned to improve the understanding of ELNES by comparing experiments with two kinds of simulations. The simulations will be done with a band-structure method (the WIEN 97 Full Linearized Augmented Plane Waves code) and a multiple scattering method (FEFF8). The first step is to implement the following effects into the codes, which have an influence on the ELNES : angular integration over the scattering vector, non-dipole terms, mixed dynamic form factor, core-hole and lifetime. Experiments and corresponding simulations will be done on a wide range of materials in order to determine which code is better in which case - and why this is so. The different material classes will be: Al and Al2O3 to study the lifetime effect, d-metals to study the core-hole, anisotropic materials (important to test the implementation of the scattering vector dependence) substitutional alloys (CuNi, TiAl) and metals that build ordered phases, perovskites and interfaces. This work will be done in collaboration with two other research institutions the Laboratoire d`etude des microstructures (LEM)-ONERA and the Laboratoire de Mecanique des Sols, Structures et Materiaux, Ecole Centrale Paris. The LEM will participate in the FEFF development and the study of, TiAl and the ECP will participate in the study of perovskites and anisotropic materials.
- Technische Universität Wien - 100%
- Bernard Jouffrey, Ecole Centrale Paris - France
- Gilles Hug, ONERA - CNRS - France
Research Output
- 305 Citations
- 10 Publications
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2005
Title Correlation and the density-matrix approach to inelastic electron holography in solid state plasmas DOI 10.1103/physrevb.71.045130 Type Journal Article Author Schattschneider P Journal Physical Review B Pages 045130 Link Publication -
2005
Title Coherence in electron energy loss spectrometry DOI 10.1016/j.elspec.2004.09.029 Type Journal Article Author Schattschneider P Journal Journal of Electron Spectroscopy and Related Phenomena Pages 81-95 -
2004
Title Electron energy loss-near edge structure as a fingerprint for identifying chromium nitrides DOI 10.1016/j.ssc.2004.01.045 Type Journal Article Author Mitterbauer C Journal Solid State Communications Pages 209-213 -
2003
Title Improvement of energy loss near edge structure calculation using Wien2k DOI 10.1016/s0968-4328(03)00030-1 Type Journal Article Author Hébert C Journal Micron Pages 219-225 -
2003
Title A proposal for dichroic experiments in the electron microscope DOI 10.1016/s0304-3991(03)00108-6 Type Journal Article Author Hébert C Journal Ultramicroscopy Pages 463-468 -
2003
Title Channeling, localization and the density matrix in inelastic electron scattering DOI 10.1016/s0304-3991(03)00107-4 Type Journal Article Author Schattschneider P Journal Ultramicroscopy Pages 453-462 -
2003
Title Anisotropy and collection angle dependence of the oxygen K ELNES in V2O5: a band-structure calculation study DOI 10.1016/s0968-4328(03)00031-3 Type Journal Article Author Su D Journal Micron Pages 227-233 Link Publication -
2002
Title Separation of pure elemental and oxygen influenced signal in ELNES DOI 10.1016/s0304-3991(02)00145-6 Type Journal Article Author Stöger M Journal Ultramicroscopy Pages 285-292 -
2002
Title The separation of surface and bulk contributions in ELNES spectra DOI 10.1016/s0304-3991(02)00144-4 Type Journal Article Author Schattschneider P Journal Ultramicroscopy Pages 91-97 -
2001
Title Orientation dependence of ionization edges in EELS DOI 10.1016/s0304-3991(00)00125-x Type Journal Article Author Schattschneider P Journal Ultramicroscopy Pages 343-353