Synchrotron Radiation induced TXRF

Research project P 14336 Synchrotron Radiation induced TXRF Christina STRELI 08.05.2000 Total Reflection X-rav Fluorescence Analysis (TXRF) is a special method of energy dispersive X-ray Fluorescence Analysis extending the analytical power to the trace element range (Detection limits in the pg (10-12 g) range). Using Synchrotron radiation (SR) as exciting radiation is features, like wide spectral range, natural collimation and high intensity allows to reduce the detection limits down to the fg(10-15 g) range, but allows also to extend the detectable element range to low Z elements (B, C,...Al) as well as to the Rear Earth Elements (REE). The aim of project is to show the power of the new developed ultra trace analytical technique of SR-TXRF and its applicability in various fields of analytical problems. Four different topics should be investigated: * The quality controll of semiconductor surface contamination (on and below surface) for low Z elements, specially Na and Al - performed at SSRL, Stanford USA, in cooperation with SSRL and Wacker Siltronic, Burghausen D. The obtained detection limits should reach the demanded values of the SEMATEC roadmap (3E8 atoms/cm2 for Na). * Investigation of low Z elements Boron, Carbon and Oxygen on semiconductor surfaces - performed at BESSY2, Berlin in cooperation with PTB-Berlin and Wacker Siltronic. * Investigation of steels samples from reactor pressure vessels, determination of exposed neutron dose by determination of Nb content- performed at HASYLAB, Hamburg in cooperation with CRPP, Lausanne, CH. * Determination of REE by K-shell excitation in special Low activity stee for fusion wall materials- performed at HASYLAB, in cooperation with CRPP. Within the mentioned international cooperations the performance of SR-TXRF should be improved by improving detection and excitation conditions and the technique should be applied to various analytical problems in industry (semiconductor industry) and research (fission and fusion research).