In-Situ Untersuchung von Prozessen auf empfindlichen Ober- flächen mittels Rasterkraftmikroskopie

In-Situ Untersuchung von Prozessen auf empfindlichen Ober- flächen mittels Rasterkraftmikroskopie

Gernot Friedbacher (ORCID: )

Disciplines

Chemistry (100%)

Keywords

    Scanning force microscopy In-Situ surface Analyses Thin Films, Corrosion, Material Science, In-Situ surface Anal, Material Science, Scanning force micro, Thin Films, Corrosio

Research institution(s)
Project participants

Research Output

  • 354 Citations
  • 8 Publications
Publications
  • 2001
    Title Analytical evaluation of tapping mode atomic force microscopy for chemical imaging of surfaces
    DOI 10.1016/s0169-4332(00)00761-3
    Type Journal Article
    Author Basnar B
    Journal Applied Surface Science
    Pages 213-225
  • 2000
    Title Structural and topographical studies of SILAR-grown highly oriented PbS thin films
    DOI 10.1016/s0025-5408(00)00298-1
    Type Journal Article
    Author Kanniainen T
    Journal Materials Research Bulletin
    Pages 1045-1051
  • 1999
    Title Substrate Effects on the Formation of Alkylsiloxane Monolayers
    DOI 10.1021/la981426i
    Type Journal Article
    Author Brunner H
    Journal Langmuir
    Pages 1899-1901
  • 1999
    Title In situ and ex situ AFM investigation of the formation of octadecylsiloxane monolayers
    DOI 10.1016/s0169-4332(98)00585-6
    Type Journal Article
    Author Resch R
    Journal Applied Surface Science
    Pages 168-175
  • 1998
    Title Roughness and deposition mechanism of DLC films prepared by r.f. plasma glow discharge
    DOI 10.1016/s0042-207x(98)00115-8
    Type Journal Article
    Author Ali A
    Journal Vacuum
    Pages 363-368
  • 1997
    Title Tapping-Mode AFM in Comparison to Contact-Mode AFM as a Tool for in Situ Investigations of Surface Reactions with Reference to Glass Corrosion
    DOI 10.1021/ac9607020
    Type Journal Article
    Author Schmitz I
    Journal Analytical Chemistry
    Pages 1012-1018
  • 1997
    Title Lateral force microscopy and force modulation microscopy on SILAR-grown lead sulfide samples
    DOI 10.1016/s0169-4332(97)00217-1
    Type Journal Article
    Author Resch R
    Journal Applied Surface Science
    Pages 51-57
  • 1997
    Title AFM studies on ZnS thin films grown by atomic layer epitaxy
    DOI 10.1016/s0169-4332(97)00226-2
    Type Journal Article
    Author Ihanus J
    Journal Applied Surface Science
    Pages 43-50