Characterisation of self-assembled dot structures by x-ray diffraction and -reflectivity techniques

Characterisation of self-assembled dot structures by x-ray diffraction and -reflectivity techniques

Petr Mikulik (ORCID: )

Wissenschaftsdisziplinen

Elektrotechnik, Elektronik, Informationstechnik (30%); Physik, Astronomie (70%)

Forschungsstätte(n)
Nationale Projektbeteiligte